Automated multi-chip module handler and testing system

ABSTRACT

An automated multi-chip module (MCM) handler for automated module testing which employs a module feed employing a plurality of stackable magazines, the leading one of which in an input stack is positively displaced through an indexing device which positively retrieves each MCM, guides it at a test site, and positively ejects a tested MCM from the test site for sort and direction along an inclined track to either a shipping tray or a discard bin. After a magazine is emptied of MCMs, it continues to an output location where it is stacked with other empty magazines. The test site includes a mechanism for positively engaging and aligning each MCM before engagement by the test contacts. A particularly suitable magazine for use with the handler is also disclosed, as is a method of module handling.

CROSS-REFERENCE TO RELATED APPLICATIONS

This application is a continuation of application Ser. No. 09/726,084,filed Nov. 29, 2000, now U.S. Pat. No. 6,414,503 B1, issued Jul. 2,2002, which is a division of application Ser. No. 09/065,799, filed Apr.23, 1998, now U.S. Pat. No. 6,229,323, issued May 8, 2001.

BACKGROUND OF THE INVENTION

1. Field of the Invention

The present invention relates to handling of multi-chip modules (MCMs)to facilitate automated testing and sorting thereof and, morespecifically, to a magazine for carrying a plurality of MCMs incooperative association with an automated module handler adaptable tohandle different types and configurations of such modules.

2. State of the Art

Production and quality demands of the computer industry, andparticularly the personal computer industry, have compelled automationof component testing with ever-higher throughputs. Individualsemiconductor dice are at least subjected to a nominal level of testingand burn-in prior to being mounted on carrier substrates, such asprinted circuit boards, and complete testing and characterization ofdice to qualify what are termed “known good die” or “KGD” are becomingmore prevalent, although by no means standard procedures. Over and abovethe testing of individual dice, however, is the requirement that amulti-chip module, comprising a carrier substrate, such as a circuitboard bearing a plurality of dice thereon, be tested and characterizedas an operational unit before being installed in a personal computer,either as original equipment or as part of an upgrade.

One particularly common type of multi-chip module is a multi-chip memorymodule, wherein a plurality of memory dice is mounted to one or bothsides of a carrier substrate, which is then installed in a card slot ina personal computer chassis to provide or upgrade the memory capacity ofthe computer by connection of the module to the computer motherboardbearing the processor and logic circuits. The most common types ofmemory modules are currently Single In-line Memory Modules (SIMMs) andDual In-line Memory Modules (DIMMs). Both SIMMs and DIMMs employmultiple pin edge connectors running along a single edge of the carriersubstrate, the edge connectors providing electrical connections to themotherboard through the chassis of the computer. The edge connectors mayinclude a single set of contacts extending about the edge, as in thecase of a SFMM, or discrete contacts on each side of the carriersubstrate adjacent the edge to provide more separate contact locations,as in the case of a DIMM.

As noted above, it is required that multi-chip modules, includingwithout limitation memory modules, be tested prior to installation toensure that they will be fully operational. Module handlers have beendeveloped to automatically present modules to a testing device or“tester”, which conducts the test of a module, the results of whichtest, in comparison to criteria preprogrammed in the tester, dictate thesort category of the module. The sort categories are conventionallyeither “pass” or “fail”, although sorting into operational subcategoriesdepending on variations in operational module performance is becomingmore common. Handlers may include a hopper or tray into which aplurality of modules is preloaded before placement on the handler, whichthen feeds one module at a time to a test site for testing through themultiple pin edge connector of the carrier substrate and, subsequently,to a receptacle based upon the module's exhibited test characteristics.

Handlers, and specifically the module conveyance systems thereof, areideally reconfigurable to accommodate different thicknesses of modules,the term “thickness” being used herein to denote the dimension of amodule perpendicular to the plane of the carrier substrate, termed a“card” or “printed circuit board”. Module thickness depends in part oncarrier substrate thickness, in part on the height of the dice(including packaging) carried by the carrier substrate, and in part onwhether dice are mounted to one or both sides of the carrier substrate.Many prior art handlers are only reconfigurable to accommodate differentmodule thicknesses through extensive and complex removal and replacementof a substantial number of parts, which takes time and often requiresthe use of various tools.

One relatively simple approach to handler conveyance systemreconfiguration is disclosed in U.S. Pat. No. 5,667,077, wherein anexisting module handler conveyance channel is made reconfigurable toaccommodate thicker or thinner modules through the insertion within thechannel of one of a plurality of different-thickness, removable,justifying plates, the channel being sized to accommodate the thickestmodule contemplated for testing by the absence of any justifying platewhatsoever. The handler type to which the modifications are suggested,exemplified by the MC Systems, Inc. Model 828-MCM and Model838-SIMM/DIMM Module Handlers, includes a vertical magazine or hopperwhich feeds modules to a belt-driven conveyance system employing theaforementioned variable-width channel to transport the modules in seriesto a test site and then to receptacles in a plurality of sortcategories. Disadvantages of such an apparatus include the need for alarge number of justifying plates if modules of a wide variety ofthicknesses are to be tested, the practice of physical stacking ofmodules on top of one another (which may lead to damage), inability toensure precise module alignment entering the conveyance system, lack ofa positive grip on each module as it is conveyed to the test site (whichmay present alignment and jamming problems), lack of positive engagementand alignment of each module with the test contacts at the test site,and the lack of a positive and certain displacement of each testedmodule from the test site when it is to be moved toward the sortreceptacles.

Another approach to module handlers is exhibited by the Exatron, Inc.Model 3000B SIMM/DIMM Handler, which employs gravity feed of singulatedmodules from a magazine along an inclined track to a test site, afterwhich a tested module either slides directly into a bin of theappropriate sort category or into an output arm over a movable tray, thearm opening to release the module into a slot of the tray when alignedtherewith. This handler is very operator time-intensive as it fails toprovide a mechanism for receiving a large number of modules for test asit is limited to a single hand-loadable magazine of a set configurationfixed to a carriage on the handler, fails to provide positive retrievalof modules from the magazine and placement at the test site, fails toprovide positive alignment of the modules at the test site, fails toprovide positive displacement of a tested module from the test site, anddoes not appear to be quickly or easily adaptable to modules of varyingthicknesses.

In short, conventional multi-chip module handlers suffer frominsufficient automated input capacity, as well as a lack of positivemodule retrieval and placement at the test site, positive modulealignment for test, and positive displacement of a tested module fromthe test site for sorting. Finally, the adaptability of conventionalhandlers to various types of modules is limited and cumbersome.

BRIEF SUMMARY OF THE INVENTION

The multi-chip module (MCM) handler of the present invention overcomesthe above-enumerated deficiencies of conventional handlers and providesnumerous additional advantages.

The inventive handler employs (module) type-specific magazines which theoperator may load with modules prior to placement on the handler, themagazines being vertically stackable at both magazine input and magazineoutput stations, each magazine being moved horizontally as it reachesthe bottom of the input stack by a positive drive system which carriesthe magazine through the indexing station for module retrieval and tothe output station, where it is again stacked, this time under thenext-previous emptied magazine. Further, the handler of the inventionprovides positive retrieval and movement of each module from itsmagazine to the test site by an indexer which guides each module andcarries it to the test site, reducing any tendency toward jamming incomparison to gravity feed-type handlers. Once at the test site,positive module location for test is effected using locating pins whichengage the module's pre-existing tooling holes in the carrier substrateto exactly align the module relative to the test contacts. The remotetest site contacts are generic to facilitate connection to testers bymany different manufacturers. Once testing is completed, positiveejection of the tested module from the test site to an output track iseffected by the indexer's arrival at the test site with another modulefor test, again reducing the jam rate in comparison to gravity-feedhandlers. Once tested, a module is consigned by the output track eitherto a shipping tray if it passes testing or to a fail bin if it does not,the handler being usable with dual-row trays of various types, the traywhen mounted on the handler being borne by a carriage movingtransversely under the path of the tested module to receive eachtest-passing module from a stop position on the output track into anempty tray receptacle, or slot. The handler, as configured, exhibits theability to accommodate many module types and configurations through easyand quick locational and orientational changes of component parts of thedevice, such changes being effected using a minimal number of parts anda single hand tool.

Also included within the invention is a method of module handling whichmay be effected by the MCM handler of the invention, as well as a modulemagazine configuration particularly suitable for use with the MCMhandler of the invention.

BRIEF DESCRIPTION OF THE SEVERAL VIEWS OF THE DRAWINGS

FIG. 1 comprises a schematic top elevation of an embodiment of themodule handler of the present invention, the perspective beingperpendicular to the incline of the front of the handler;

FIG. 2 comprises a schematic side elevation of the module handlerembodiment of FIG. 1;

FIG. 3 comprises a schematic rear elevation of the module handlerembodiment of FIG. 1;

FIG. 4 comprises a top perspective view of a module magazine for themodule handler of the present invention;

FIG. 5 comprises a bottom perspective view of the magazine of FIG. 4;

FIG. 6 is a top elevation of an exemplary multi-chip module in the formof a DIMM which may be handled by the magazine and module handler of thepresent invention;

FIG. 7 is a perspective view of a shipping tray usable with the handlerof the present invention; and

FIGS. 8 through 10 comprise detailed perspective views of some of thecomponent assemblies of the handler of the present invention,illustrating the manner in which certain components may be relocated toaccommodate modules of differing thicknesses.

DETAILED DESCRIPTION OF THE INVENTION

Referring now to FIGS. 1 and 2 of the invention, an embodiment 10 of themodule handler of the present invention is schematically illustrated. Asdepicted in FIG. 2, the front face 12 of handler 10 is inclined at abouta 35° angle to the horizontal to provide gravity assist to modulemovement. A tester 14 for testing the modules being processed by handler10, which may comprise any one of a number of commercially offeredtesters, resides within the housing 16 of handler 10. One preferredtester usable with handler 10 is the Sigma 2 Tester offered by DarkhorseSystems, Inc. of Austin, Texas. The operation of handler 10 as toactivation and sequencing of the various movable components andassemblies thereof, as well as initiation of the test sequence of tester14, is controlled by a programmed controller 18, which may comprise anysuitable commercially offered controller. One preferred controller isthe Model 101-0092 Controller offered by Z World Engineering of Davis,California. As noted below, various sensors may also be employed toprovide signals to controller 18 for initiation or cessation of activityof a particular component or assembly.

Commencing at the top of handler 10, magazine input station 20 includesa magazine input zone 22 where a plurality of magazines 100 may bestacked. As can best be seen in FIG. 2, the magazine input stack (andalso the output stack, as described later herein) is actually verticalor perpendicular with respect to the inclined front face 12 of handler10 and not in the absolute sense, but will be described herein as beinga “vertical” stack for the sake of convenience. Each magazine 100 of theinput stack contains a plurality of multi-chip modules 200 such as, byway of example only, DIMMs or SIMMs, which are located in slots 102 inthe magazines 100 and which are oriented in a mutually parallelrelationship (see FIGS. 4 and 5). As seen in FIG. 3, input station 20also includes an elevator 24 having upwardly projecting rams 26 locatedbetween drive belts 30 and 32 (FIG. 2) to lower the magazine stack asrequired when the former lowermost magazine 100 a has moved horizontallyout from under the stack so as to provide another full magazine 100 b inthe lowermost position. Input station 20 also includes a plurality(preferably four, spaced near each of the four corners of the input zone22) of selectively extendable and retractable dogs 28 carried by astructure (not shown) extending above the front face 12 of handler 10and located at an elevation to suspend a second-lowest magazine 100 c inthe input stack above the lowermost magazine 100 b so that when elevator24 has lowered magazine 100 b completely, it may move horizontally fromunder the suspended magazine 100 c.

Magazines 100 are positively driven horizontally away from input station20 and toward an indexing station 40 by two parallel, continuous,toothed drive belts 30 and 32, each sliding on underlying rails 34extending between input station 20 and output station 90 for verticalsupport, belt 32 engaging cooperating teeth 104 of like pitch at eachend of each magazine 100 (see FIGS. 4 and 5). It is also contemplatedthat smooth-surfaced drive belts may be employed, engagement with andmovement of the magazines 100 being effected by friction alone, but suchan alternative is less preferred due to the potential for reducedprecision in positioning the magazine 100.

Before proceeding further with a description of handler 10, it will behelpful to further describe magazine 100, which itself comprises part ofthe present invention, with reference to FIGS. 4 and 5. Each magazine100 includes, as noted previously, a plurality of mutually parallelslots 102 oriented transversely to the length of the magazine 100 andits direction of travel through handler 10. One side 106 of magazine 100is of a height substantially the same as the baffles 108 which defineslots 102 therebetween, while the other, “open” side 110 is of asubstantially lower height, providing only a small lip against whichmodules 200 rest when magazine 100 is tilted at a 35° angle to thehorizontal on the front face 12 of handler 10 (see FIG. 2). Teeth 104are located on the bottom of side 110 at each end of magazine 100.Baffles 108 are each notched at the same two locations 112 and 114toward side 106 to provide, in combination, two longitudinally extendingslots into which a metal, slat, bar or rod 115 may be inserted toshorten, if necessary, the effective length of each slot 102 to snuglyaccommodate modules 200 shorter than the total slot length and preventshifting and possible damage to the modules 200 during handling of themagazine 100. Upwardly extending post-like elements 116 with protrusions118 are located at each corner of magazine 100, and receptacles 120 areformed on the underside of each magazine 100 at locations to receive theprotrusions 118 of another magazine 100 placed there underneath. Theunderside of each magazine 100 also includes twolongitudinally-extending, mutually parallel recesses 122 and 124 whichextend upwardly from the bottom of the magazine 100 a distance slightlylarger than the height of side 110. Recesses 122 and 124 intersect slots102, so that the carrier substrates of modules 200 loaded into slots 102will extend into and across the recesses 122 and 124. Finally, theunderside of magazine 100 may include a shallow, longitudinallyextending recess 126 running along and under side 106 to assist magazine100 in tracking on drive belt 30. Any suitable number of slots 102 maybe employed in magazine 100 as sized and configured for use with inputstation 20 and output station 90, at appropriate spacing to accommodateadjacent modules 200 received therein without interference. As shown inFIG. 4, magazine 100 comprises a thirty-five slot magazine adapted toreceive modules with dice on only one side of the carrier substrate,although twenty-five slot magazines of the same length are alsopreferred for relatively thicker modules such as those having dice onboth sides of the carrier substrate.

Returning to FIGS. 1-3, as magazine 100 a moves through indexing station40, each module 200 is removed by indexing head 42 in cooperation withelevating ramps 44 (see FIGS. 1 and 3) as that module 200 is in verticalalignment with indexing head 42. Indexing head 42 is movable in the X-and Y- directions as shown in FIG. 2, and indexing fingers 46 and 48 arespaced to closely bracket the leading and trailing edges of a module 200when indexing head 42 is moved downwardly thereover. As magazine 100 aapproaches indexing station 40, the bottom of each module 200 iscontacted by inclined leading surfaces 44 a of ramps 44 (see FIG. 3),the ramps 44 being aligned with recesses 122 and 124 of magazine 100 atraveling thereover, each module 200 being gradually raised as it rideson ramps 44 as the magazine 100 a travels toward indexing station 40until that module 200 is resting on a horizontal upper surface 44 b ofthe ramp 44 when aligned with the indexing head 42 at an elevationslightly above the height of a retaining lip provided by side 110 of themagazine 100 a. At this point, indexing head 42 moves in the X-directionto test site 50, sliding and guiding module 200 therewith. It is alsocontemplated that elevating rams aligned with indexing station 40 mightbe employed in lieu of ramps 44 to raise each module for engagement andmovement by the indexing head 42, but this alternative structure wouldadd some cost and complexity to the handler 10, as well as requiringadditional programming for controller 18.

At test site 50, between test site guide rails 52 (see FIGS. 1 and 2)and while still constrained by indexing head 42, module 200, still in avertical orientation as removed from magazine 100, is precisely alignedwith respect to the test contacts which will engage the module's edgeconnectors 202 at the edge of carrier substrate 204 (see FIG. 6, whereinsemiconductor memory dice 208 borne by carrier substrate 204 are alsodepicted) by insertion of locating pins 54 extendable transversely oncarriage 56 (also termed a module locator bar) through tooling holes 206in substrate 204. In FIGS. 1 and 9, right-hand guide rail 52 has beencut away for a better view of locating pins 54 and carriage 56therebelow. Carriage 56 is replaceable by the operator to accommodatemultiple module configurations having tooling holes 206 at differentlocations on the variously sized substrates. For example only, and notby way of limitation, carriage 56 may be changed out to accommodate achange from a 72-pin to 168-pin module handling. The unused or “spare”carriage or locator bar or bars 56 to accommodate different moduleconfigurations may be carried on the handler 10 at the test site.

After alignment, test contact clamps 58 (see FIG. 2) clamp test contactsto their target edge connectors 202, as known in the art, and indexinghead 42 is withdrawn upwardly in the Y-direction and moved back overmagazine 100 a at indexing station 40 in the X-direction for retrievalof the next module 200, which is advanced for retrieval by movement ofmagazine 100 a by drive belts 30 and 32. Tester 14 conducts a test ofmodule 200 at the test site through test contact clamps 58 in accordancewith the tester's programming and as known in the art.

When the next module 200 is advanced to test site 50 by indexing head42, the tested module 200 a at test site 50 has already been releasedand will normally slide downwardly along output track 60 between guiderails 62. However, if the tested module 200 a has not moved from testsite 50, indexing head 42 guiding the next module 200 from magazine 100at indexing station 40 will positively eject the tested module 200 afrom test site 50, pushing it onto output track 60.

If tested module 200 a has passed the testing, it will be stopped ateither upper stop 70 or lower stop 72, both of which are located aboveslide gate 74 which covers an aperture 76 in the bottom of output track60. Upper stop 70 is located on output track 60 to stop a module 200above a slot 302 of an upper row of slots 302 in a shipping tray 300(see FIG. 7 for shipping tray details), while lower stop 72 is locatedto stop a module above a slot 302 of a lower row of slots 302 in theshipping tray 300, which is secured to a motor-driven carriage 80movable on linear bearings transversely under output track 60 from leftto right (as looking at FIG. 1). In operation, carriage 80 with an emptyshipping tray 300 (see FIG. 7 for a detailed view of an exemplaryshipping tray) is initially moved from a start position to the left ofthe output track 60 toward the right a distance so that the right-handuppermost row tray slot 302 and lower row tray slot 302 are respectivelyaligned with upper and lower stops 70 and 72. When a tested, passedmodule 200 slides down output track 60, lower stop 72 is actuated tostop it above lower slot 302, whereupon slide gate 74 is retracted andmodule 200 drops a short distance into aligned lower tray slot 302. Thenext passed module 200 is stopped by upper stop 70 and dropped byretracted slide gate 74 into upper tray slot 302. Carriage 80 thenadvances to the right a distance equal to that between adjacent,parallel slot centers in the same slot row of shipping tray 300 to alignthe next set of empty upper and lower tray slots 302 with output track60, and the sequence is repeated during module testing until shippingtray 300 is full. If a failed module 200 is released from the test site50, neither stop 70 or 72 is actuated and the module 200 slides thelength of output track 60 into discard bin 82 at the bottom thereof. Asthe shipping tray 300 is filled with passed modules 200, it movesprogressively toward the right until it has passed completely underoutput track 60. When completely full, the shipping tray 300 is cycledback to the left on carriage 80 and removed therefrom, and an emptyshipping tray 300 secured thereto. If different shipping trays are to beemployed with carriage 80, changeable adapters 84 (see FIG. 2) boltableto carriage 80 may be employed to accommodate different trays.

Returning to the top of handler 10, when a magazine 100 such as magazine100 a has passed completely through indexing station 40, it continuesits movement on drive belts 30 and 32 to output stack zone 92 of outputstation 90, wherein an elevator 94 having rams 96 and a set of fourspring-loaded, extendable dogs 98 respectively operate to lift and thensuspend an empty magazine 100 from drive belts 30 and 32 at a levelhigher than that of a magazine 100. Specifically, and with reference toFIG. 3, the previous empty magazine 100 d, as shown, has been raised toa level immediately above spring-loaded dogs 98, which are located at anelevation higher than the height of magazines 100, so that magazine 100a may travel under magazine 100 d to a position in vertical alignmenttherewith. Magazine 100 a is then raised by rams 96 of elevator 94extending between drive belts 30 and 32 to contact the underside ofmagazine 100 d, which retracts spring-loaded dogs 98 by contacttherewith as it moves upwardly, and the stack of magazines 100 isfurther raised by movement of magazine 100 d until the output stationdog locations are cleared by the underside of magazine 100 a, at whichpoint dogs 98 are again extended by their biasing springs in a “ratchet”effect and elevator rams 96 are lowered by elevator 94 so as not tointerfere with the next magazine 100 arriving at output station 90 ondrive belts 30 and 32. It will also be understood that powered,selectively extendable dogs as employed at the input station 20 mightoptionally be employed at output station 90. However, such anarrangement would, of necessity, add complexity and cost to handler 10as well as require additional programming for controller 18.

It should be noted at this time that the various components of handler10 may be easily adjusted to accommodate different lengths, heights andthicknesses of modules 200 as required. For example, and with referenceto FIGS. 8 through 10, wherein detailed views of various components andassemblies of handler 10 are depicted, quick release pins P are employedat various locations in conjunction with appropriately located receivingapertures A to position the components connected by the quick releasepins P to underlying stationary components to accommodate various widthsand heights of modules. In a similar manner, Allen head bolts B areemployed with different threaded bores T to relocate other components,such as changing the height of test site guide rails 52. In a similarmanner, the longitudinal location of upper and lower stops 70 and 72along output track 60 to accommodate different shipping trays may bechanged by loosening bolts B, sliding the associated stop up or down thetrack, and retightening the bolts B. Stop elements 70 a and 72 a of eachrespective stop 70 and 72 (see FIG. 10) include thicker and thinner endsto alternately project into output track 60, and are rotatablyreversible (see arrows) to accommodate double or single-sided modules200 (i.e., in terms of dice on both or only one side of the carriersubstrate) in combination with output track guide rail 62 locationalchanges. Different sets of stop elements (each stop element beingreversible as described) may be also used, for example, to preciselyaccommodate different dice heights, such as thin small outline package(TSOP) dice versus small outline j-lead (SOJ) dice. If used, thedifferent sets of elements may be carried on handler 10 next to outputtrack 60. While not illustrated in detail, indexing fingers 46 and 48may be adjusted in height, and indexing finger 48 adjusted inlongitudinal location on indexing head 42 using bolts B and incombination with different threaded bores T on indexing head 42, whilestop block 49 is rotationally reversible to provide a different stoppoint when retrieving DIMMs versus SIMMs from a magazine 100 (see FIG.2). For simplicity, components previously identified in conjunction withFIGS. 1-7 bear the same reference numerals in FIGS. 8-10.

It should also be noted that the drive systems of the various mechanismsdescribed herein are conventional, and that electric, hydraulic andpneumatic drives may be interchanged as appropriate and dictated bysuitability of each for a particular purpose. For example, indexing head42 is preferably driven by two double-acting air (pneumatic) cylinders,one each for the X- and Y-directions. Similarly, carriage 56 bearinglocating pins 54 is driven by a similar air cylinder, as are testcontact clamps 58, as well as upper and lower stops 70 and 72, slidegate 74, elevators 24 and 94 and dogs 28 and 98. However, hydraulic orelectric drives for these components, or any of them, may besubstituted. Belts 30 and 32 are preferably driven by an electric rotarystepper motor or precise control of magazine advance through indexingstation 40.

Finally, in order to confirm proper operational positioning of thevarious movable components of the handler 10 and of the modules 200being handled for test and sort and avoid unnecessary cycling andjamming of handler 10, it is preferred that a number of sensors beplaced at suitable locations. Depending on the parameter to be detectedby a sensor, or control to be effected in response to the position of acomponent or module, proximity or through-beam sensors, or autoswitchsensors, all as know in the art, may be employed and signals therefromcommunicated to controller 18 to trigger or halt a particularoperational sequence of the handler 10. Such sensors and their use beingwell known in the art, and their placement being a matter of discretionby the designer as a function of the need to confirm various componentand module positions, no further description thereof will be offeredherein.

While the present invention has been described in the context of acertain preferred embodiment, those of ordinary skill in the art willunderstand and appreciate that it is not so limited. Specifically,additions, deletions and modifications to the invention as disclosedherein may be made without departing from the scope of the invention asdefined by the claims hereinafter set forth.

What is claimed is:
 1. A system for testing multi-chip modules (MCMs),comprising: a magazine input location configured to receive a magazinecontaining a plurality of MCMs; a magazine output location configured toreceive a magazine emptied of MCMs; a magazine drive configured toadvance a magazine from the magazine input location, through an indexingstation and to the magazine output location; the indexing stationincluding an indexing head configured and oriented to singulate andguide an MCM from a magazine to a test station as the magazine isadvanced through the indexing station; the test station including a testhead, the test head including a plurality of test contacts configured toengage an MCM presented at the test station, wherein the test station isconfigured to administer a predetermined test to an engaged MCM throughthe plurality of test contacts; at least a first MCM output locationconfigured to allow passage of MCMs passing the predetermined test; andat least a second MCM output location configured to allow passage ofMCMs not passing the predetermined test, wherein the at least a firstMCM output location, the at least a second MCM output location, themagazine input location and the magazine output location are mutuallyremotely located.
 2. The system of claim 1, further including an MCMlocating device associated with the test station configured topositively align an MCM for engagement by the plurality of testcontacts.
 3. The system of claim 2, wherein the MCM locating deviceincludes at least one locating pin extendable through at least onetooling hole of the MCM presented at the test station.
 4. The system ofclaim 3, wherein the at least one locating pin comprises two locatingpins disposed on a carriage selectively movable toward and away from thepresented MCM engaging and disengaging two tooling holes thereof.
 5. Thesystem of claim 3, wherein the plurality of test contacts are carried onclamp elements movable toward and away from the presented MCM.
 6. Thesystem of claim 1, further including an inclined output track having abottom, planarly aligned with and sloping downward from the teststation.
 7. The system of claim 6, wherein the at least a first MCMoutput location further includes at least one module stop associatedwith the inclined output track positioned to selectively stop an MCMmoving therethrough.
 8. The system of claim 7, wherein the at least afirst MCM output location further includes a selectively openable outletassociated with the at least one module stop configured to release astopped MCM through the inclined output track bottom.
 9. The system ofclaim 8, wherein the selectively openable outlet comprises an aperturecovered by a slide gate.
 10. The system of claim 8, further comprising ashipping tray carriage movable under the inclined output track along apath and a shipping tray including a plurality of module receptacles,the shipping tray being secured to the shipping tray carriage such thatthe module receptacles are sequentially alignable with the selectivelyopenable outlet .
 11. The system of claim 8, further including an outletat the bottom of the inclined output track wherein the at least a secondMCM output location includes a bin associated with the outlet at thebottom of the inclined output track.
 12. The system of claim 1, furtherincluding a controller for controlling operation of the system.
 13. Thesystem of claim 1, wherein the magazine input location further includesa magazine input station comprising a magazine input zone configured toreceive a plurality of substantially vertically stacked magazines, anelevator configured to lower a lowermost magazine in the input zone atan elevation greater than a height of a magazine to a lower elevationfor engagement by the magazine drive, and selectively actuable retentionelements arranged to retain a magazine at the greater elevation.
 14. Thesystem of claim 1, wherein the magazine output location further includesa magazine output station comprising a magazine input zone configured toreceive a plurality of substantially vertically stacked magazines, anelevator configured to raise a lowermost magazine in the input zone toan elevation greater than a height of a magazine from a lower elevationfor disengagement from the magazine drive, and spring-biased retentionelements arranged to retain a magazine at the greater elevation.
 15. Thesystem of claim 1, wherein the magazine drive comprises at least onemovable belt extending between the magazine input location and themagazine output location through the indexing station, the at least onemovable belt having structure thereon formed to engage cooperativestructure associated with a magazine being moved by the at least onemovable belt.
 16. The system of claim 15, wherein the at least onemovable belt comprises two parallel and laterally spaced movable belts.17. The system of claim 16, further comprising a structure locatedbetween the two parallel and laterally spaced movable belts configuredto lift an MCM carried by a magazine when aligned with the indexing headto release the MCM from the magazine for guidance by the indexing head.18. The system of claim 1, wherein the magazine drive is configured tomaintain a magazine driven thereby in an angular orientation.
 19. Thesystem of claim 18, wherein the magazine drive is configured to maintainthe driven magazine at an angle of approximately 35° from horizontal.20. The system of claim 19, wherein the magazine input location and themagazine output location are configured to be at substantially the sameelevation.